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Microscopy Ontology (MO)

This version:
https://w3id.org/pmd/mo/1.1
Revision:
1.1
Authors:
https://orcid.org/0000-0002-3717-7104
https://orcid.org/0000-0002-7094-5371
Imported Ontologies:
prov-o#
prov-o-inverses#
co
Download serialization:
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License:
http://insertlicenseURIhere.org
Visualization:
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Cite as:
Markus Schilling, June Lau, Bernd Bayerlein. (July 22th, 2024) MO: microscopy ontology. Version 1.1, https://w3id.org/pmd/mo/
Provenance of this page
Ontology Specification Draft

Table of contents

Microscopy Ontology (MO): Overview back to ToC

This ontology has the following classes and properties.

Classes

Annotation Properties

Cross-reference for Microscopy Ontology (MO) classes, object properties and data properties back to ToC

This section provides details for each class and property defined by Microscopy Ontology (MO).

Classes

3D Coordinatesc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/3DCoordinates

Coordinates that specify a point in three-dimensional space.

Is defined by
https://w3id.org/pmd/mo
has super-classes
coordinates c
has sub-classes
3D X Coordinate c, 3D Y Coordinate c, 3D Z Coordinate c

3D X Coordinatec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/3DXCoordinate

The X-coordinate in a three-dimensional coordinate system.

Is defined by
https://w3id.org/pmd/mo
has super-classes
3D Coordinates c

3D Y Coordinatec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/3DYCoordinate

The Y-coordinate in a three-dimensional coordinate system.

Is defined by
https://w3id.org/pmd/mo
has super-classes
3D Coordinates c

3D Z Coordinatec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/3DZCoordinate

The Z-coordinate in a three-dimensional coordinate system.

Is defined by
https://w3id.org/pmd/mo
has super-classes
3D Coordinates c

4D Scanning Transmission Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/4D-ScanningTransmissionElectronMicroscopy

4D-STEM is a technique that adds an additional dimension of information, time, to STEM imaging, allowing the study of dynamic processes in materials at high spatial and temporal resolutions.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Transmission Electron Microscopy c

Aberrationc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Aberration

Deviation from the ideal or expected behavior, often used in the context of optical systems.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c
has sub-classes
Chromatic Aberration c, Spherical Aberration c

Acceleration Voltagec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/AccelerationVoltage

The acceleration voltage determines the kinetic energy of the electrons and affects the resolution and depth of penetration in the sample.

This class decribes the voltage applied to an electron microscope to accelerate the electrons emitted from the electron source (usually a cathode) towards the specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Voltage c

Acquisition Datec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/AcquisitionDate

The date when the image or data was acquired.

Is defined by
https://w3id.org/pmd/mo
has super-classes
date c

Acquisition Timec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/AcquisitionTime

The time when the image or data was acquired.

Is defined by
https://w3id.org/pmd/mo
has super-classes
time c

Actual Magnificationc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ActualMagnification

Actual Magnification refers to the true magnification level achieved in an electron microscope, which may differ from the indicated magnification.

Source
ChatGPT 3.5
has super-classes
Magnification c

Agec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Age

The duration that an object or organism has existed.

Is defined by
https://w3id.org/pmd/mo
has super-classes
duration c

Anglec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Angle

In geometry and trigonometry, an angle is a measure of the amount of rotation needed to bring one line or plane into coincidence with another. An angle is formed by two rays that share a common endpoint, known as the vertex of the angle. The rays are referred to as the sides of the angle.

Note: The concept of an angle is fundamental in geometry and is often used to describe the relative orientation of lines, planes, or surfaces. Angles are typically measured in degrees (°) or radians (rad).

has super-classes
value object c
has sub-classes
Convergence Angle c, Rotation Angle c, Tilt Angle c

Annular Bright Field Scanning Transmission Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/AnnularBrightFieldScanningTransmissionElectronMicroscopy

ABF STEM is a technique that utilizes a specific arrangement of detectors to enhance contrast in STEM images, particularly for heavy elements.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Transmission Electron Microscopy c

Annular Dark Field Scanning Transmission Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/AnnularDarkFieldScanningTransmissionElectronMicroscopy

ADF STEM is a technique that utilizes a specific arrangement of detectors to create contrast in STEM images based on the scattered electrons.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Transmission Electron Microscopy c

Anodec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Anode

The anode is the positively charged electrode in an electrochemical cell or other electrically driven systems. It serves as the site where oxidation occurs, meaning electrons are released from the anode, typically moving towards the cathode. In devices like batteries, the anode is where electrons are produced during the discharge process.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Electrode c

Aperturec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Aperture

An opening through which light or other radiation enters a camera or other optical instrument.

Is defined by
https://w3id.org/pmd/mo
has super-classes
component c
has sub-classes
Condensor Aperture c, Disc Aperture c, Objective Aperture c, Thin Foil Aperture c

Aperture Sizec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ApertureSize

The size of the opening in an aperture, affecting the amount of light or radiation passing through.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Atmospheric Scanning Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/AtmosphericScanningElectronMicroscopy

Atmospheric Scanning Electron Microscopy is a technique that allows samples to be imaged in their natural, hydrated state at atmospheric pressure. It enables the observation of biological and other hydrated specimens without the need for dehydration or coating.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Electron Microscopy c

Atomic Resolutionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/AtomicResolution

The ability to resolve individual atoms in an image or structure.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Resolution c

Auger Electron Spectroscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/AugerElectronSpectroscopy

Auger Electron Spectroscopy (AES) is a surface analysis technique used in the field of materials science and surface chemistry. It involves the study of the interactions between high-energy electrons and atoms on the surface of a material. The process is named after Pierre Auger, who made significant contributions to the understanding of this phenomenon. In AES, a sample's surface is bombarded with a beam of high-energy electrons, which causes inner-shell electrons to be ejected from the atoms in the sample. These vacancies are then filled by higher-energy electrons from outer shells, leading to the emission of Auger electrons. The energy of these emitted Auger electrons is characteristic of the specific elements present in the sample and their chemical states. By analyzing the energy spectrum of the emitted Auger electrons, researchers can identify the elements present on the surface of the material and determine their relative concentrations. Auger Electron Spectroscopy provides valuable information about the elemental composition and chemical bonding of the top few atomic layers of a material, making it a powerful tool for studying surface properties, thin films, and interfaces in various scientific and industrial applications.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Spectroscopy c

Beamc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Beam

A stream of electrons emitted from the electron source and directed towards the specimen in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
object c
has sub-classes
Coherent Beam c, Electron Beam c, Electron Probe c, Focused Beam c, Incident Beam c, Ion Beam c, Monochromatic Beam c, Primary Beam c

Beam Currentc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamCurrent

The intensity of the electron beam, measured as the number of electrons passing through a given area per unit time.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Current c

Beam Energyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamEnergy

The energy of a particle or photon beam used in various analytical techniques.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Energy c

Beam Offset Xc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamOffsetX

The offset of the electron beam along the X-axis in electron microscopy.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Beam Offset Yc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamOffsetY

The offset of the electron beam along the Y-axis in electron microscopy.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Beam Pathc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamPath

The trajectory followed by the electron beam as it travels through the electron microscope, from the electron source to the specimen and then to the detector.

Is defined by
https://w3id.org/pmd/mo
has super-classes
object c

Beam Shift Xc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamShiftX

The shift of the electron beam along the X-axis in electron microscopy.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Beam Shift Yc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamShiftY

The shift of the electron beam along the Y-axis in electron microscopy.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Beam Tilt Xc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamTiltX

Beam Tilt X refers to the tilting of the electron beam in the X-axis direction within an electron microscope.

Source
ChatGPT 3.5
has super-classes
value object c

Beam Tilt Yc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BeamTiltY

Beam Tilt Y refers to the tilting of the electron beam in the Y-axis direction within an electron microscope.

Source
ChatGPT 3.5
has super-classes
value object c

Biasc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Bias

A voltage or other value that influences the operation of an electronic component.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Bright Field Transmission Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/BrightFieldTransmissionElectronMicroscopy

Bright Field TEM is an imaging mode in transmission electron microscopy where regions of the sample that scatter electrons less appear brighter in the resulting image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
transmission electron microscopy c

Brightnessc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Brightness

The level of light intensity in an image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Camera Lengthc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/CameraLength

The distance between the specimen and the camera used to capture images in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
Example
STEM camera length
has super-classes
length c

Cathodec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Cathode

The cathode is the negatively charged electrode in an electrochemical cell or other electrical systems. It is the site where reduction occurs, leading to the acceptance of electrons from the external circuit. In batteries, for instance, the cathode is where electrons are consumed during the discharge process.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Electrode c

CEOS-CEFID Filterc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/CEOS-CEFIDfilter

A CEOS-CEFID Filter is a specialized energy filter used in electron microscopes for enhancing image contrast and resolution.

Source
ChatGPT 3.5
has super-classes
Energy Filter c, Image Filter c

Chamberc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Chamber

Chamber refers to the enclosed space within an electron microscope where the sample is placed and vacuum conditions are maintained.

Source
ChatGPT 3.5
has super-classes
object c

Chamber Vacuumc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ChamberVacuum

The vacuum level inside the chamber of an electron microscope or other device.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Vacuum c

Channelc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Channel

A path along which signals such as data or electrical impulses are transmitted.

Is defined by
https://w3id.org/pmd/mo
has super-classes
object c

Chromatic Aberrationc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ChromaticAberration

The failure of a lens to focus all colors to the same convergence point.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Aberration c

Coherent Beamc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/CoherentBeam

An electron beam in which the individual electrons maintain a constant phase relationship with each other, resulting in interference patterns when interacting with a sample.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Beam c

Collection Efficiencyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/CollectionEfficiency

The ability of a detector or system to capture and record relevant signals or data.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Efficiency c

Collectorc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Collector

A device that collects charged particles or radiation in a microscope or other instrument.

Is defined by
https://w3id.org/pmd/mo
has super-classes
processing node c

Condensor Aperturec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/CondensorAperture

An aperture that controls the amount of light entering the condenser lens system in a microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Aperture c

Condensor Lensc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/CondensorLense

A condenser lens is an optical element used in microscopy and other optical systems to focus and control the illumination on the sample being observed. It is positioned below the light source and directs light rays onto the specimen, making the illumination uniform and optimizing the quality of the sample's image. The condenser lens helps enhance contrast, resolution, and overall image quality by ensuring that a consistent and concentrated light beam illuminates the specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Lens c

Confocal Laser Scanning Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ConfocalLaserScanningMicroscopy

Confocal Laser Scanning Microscopy (CLSM) is an optical imaging technique that enhances resolution and eliminates out-of-focus blur by using a spatial pinhole and laser illumination. A focused laser beam is scanned across the sample's surface or depth, and only the light emitted from the focal plane (or a defined section) passes through the pinhole to form an image. CLSM provides high-resolution three-dimensional images, making it popular for biological imaging and studying fluorescently labeled samples.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Light Microscopy c

Contrastc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Contrast

The difference in luminance or color that makes objects distinguishable in an image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Convergence Anglec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ConvergenceAngle

The convergence angle affects the depth of field and resolution of the image.

The angle at which the electron beam converges onto the specimen in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Angle c

Convergent Beam Electron Diffractionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ConvergentBeamElectronDiffraction

Convergent Beam Electron Diffraction is a technique in electron microscopy where a convergent electron beam is used to form diffraction patterns, allowing for precise analysis of crystal structures.

Source
ChatGPT 3.5
has super-classes
Electron Diffraction c

Cryo Electron Tomographyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/CryoElectronTomography

Cryo Electron Tomography is a form of electron tomography that is performed at cryogenic temperatures. It is used to study the three-dimensional structure of frozen-hydrated samples.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Electron Tomography c

Cryo Scanning Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Cryo-ScanningElectronMicroscope

A cryo-scanning electron microscope is typically used for imaging biological samples.

A type of electron microscope that operates under cryogenic temperatures.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Electron Microscope c

Cryo Transmission Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/CryoTransmissionElectronMicroscope

A transmission electron microscope that operates at cryogenic temperatures.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Transmission Electron Microscope c

Currentc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Current

The current is typically measured in amperes (A).

The flow of electric charge.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c
has sub-classes
Beam Current c, Emission Current c, Filament Current c, Probe Current c

Detectorc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Detector

A device used to detect and measure properties such as light, radiation, or particles.

Is defined by
https://w3id.org/pmd/mo
has super-classes
processing node c
has sub-classes
Scintillator c, Silicon Drift Detector c, Spectrometer c

Detector Quantum Efficiencyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DetectorQuantumEfficiency

The efficiency with which a detector converts incident radiation into useful signals.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Efficiency c

Diffractionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Diffraction

The bending of electron waves as they pass through a crystalline sample, resulting in the formation of diffraction patterns that provide information about the crystal structure.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Physical Process c
has sub-classes
Electron Diffraction c, X-ray Diffraction Röntgenbeugung c

Diffraction Patternc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DiffractionPattern

The pattern of spots or bands produced on a detector when electrons diffract after interacting with a crystalline sample.

Is defined by
https://w3id.org/pmd/mo
has super-classes
digital entity c
has sub-classes
Electron Diffraction Pattern c

Disc Aperturec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DiscAperture

A circular aperture used to limit the beam size in an optical instrument.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Aperture c

Disk Of Least Confusionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DiskOfLeastConfusion

The region in the image plane of an electron microscope where the electron beam is focused to the smallest spot size, minimizing the blurring effect due to spherical aberration.

Is defined by
https://w3id.org/pmd/mo
has super-classes
cross section area c

Drift Correctionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DriftCorrection

Drift Correction refers to techniques used in electron microscopy to compensate for the slow movement of the sample or beam, ensuring image stability and accuracy.

Source
ChatGPT 3.5
has super-classes
analysing process c

Dwell Timec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DwellTime

The amount of time that the electron beam is focused on a specific point or region of interest on the specimen during imaging or analysis.

Is defined by
https://w3id.org/pmd/mo
has super-classes
duration c

Dynamic Focus Correctionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DynamicFocusCorrection

A technique used in electron microscopy to continuously adjust the focus of the electron beam in real-time to maintain optimal image quality, especially when imaging uneven or rough surfaces.

Is defined by
https://w3id.org/pmd/mo
has super-classes
analysing process c

Dynamic Refocusingc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DynamicRefocusing

The process of adjusting the focus of the electron beam during imaging to compensate for changes in the specimen height or topography, ensuring that the entire specimen remains in focus.

Is defined by
https://w3id.org/pmd/mo
has super-classes
analysing process c

Dynamic Transmission Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/DynamicTransmissionElectronMicroscopy

Dynamic Transmission Electron Microscopy is a technique that uses ultrafast electron pulses to capture rapid processes in materials with nanosecond to picosecond time resolution.

Is defined by
https://w3id.org/pmd/mo
has super-classes
transmission electron microscopy c

Efficiencyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Efficiency

The ratio of useful output to total input in any system.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c
has sub-classes
Collection Efficiency c, Detector Quantum Efficiency c

Electrodec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Electrode

An electrode is a conductor through which electric current enters or exits a substance. In the context of electrochemical systems, an electrode facilitates the transfer of electrons between a solid material and an electrolyte. Electrodes are essential components in batteries, fuel cells, electroplating, and other electrochemical processes. They play a critical role in facilitating chemical reactions and energy storage or conversion.

Is defined by
https://w3id.org/pmd/mo
has super-classes
processing node c
has sub-classes
Anode c, Cathode c

Electron Backscatter Diffractionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronBackscatterDiffraction

Electron Backscatter Diffraction is a microscopy technique used to analyze the crystallographic orientation and microstructure of materials. It involves directing an electron beam onto a sample's surface and measuring the backscattered electrons. By analyzing the diffraction patterns of these electrons, researchers can determine the crystallographic orientation of the material's grains.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Electron Diffraction c

Electron Beamc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronBeam

A stream of electrons emitted from an electron source and accelerated towards the specimen in an electron microscope for imaging or analysis.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Beam c

Electron Channeling Contrast Imagingc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronChannelingContrastImaging

Electron Channeling Contrast Imaging is a technique used in SEM or TEM to study crystallographic defects, such as dislocations, in crystalline materials. It utilizes the contrast resulting from the deviation of electron trajectories due to crystal defects.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Electron Microscopy c

Electron Diffractionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronDiffraction

The phenomenon of electron waves diffracting as they pass through a crystalline sample, providing information about the crystal structure.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Diffraction c
has sub-classes
Convergent Beam Electron Diffraction c, Electron Backscatter Diffraction c, Precession Electron Diffraction c, Selected Area Electron Diffraction c

Electron Diffraction Patternc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronDiffractionPattern

The pattern of spots or rings produced on a detector when electrons diffract after interacting with a crystalline sample, used to determine the crystal structure.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Diffraction Pattern c

Electron Energy Loss Spectrometerc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronEnergyLossSpectrometer

An Electron Energy Loss Spectrometer is a device used to measure the energy loss of electrons as they pass through a sample, providing information on the sample's composition and electronic structure.

Source
ChatGPT 3.5
is equivalent to
has function some Energy Filter c
has function some Image Filter c
relates to some CEOS-CEFID Filter c
relates to some Gatan Image Filter c
has super-classes
Spectrometer c

Electron Energy Loss Spectroscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronEnergyLossSpectroscopy

Electron Energy Loss Spectroscopy (EELS) is a specialized analytical technique in the field of materials science and electron microscopy. It involves the measurement of the energy loss of electrons as they interact with a sample. EELS is commonly performed in transmission electron microscopy (TEM) setups. In EELS, a focused beam of high-energy electrons is directed at a sample. As these electrons pass through the material, they can lose energy through various interactions, such as inelastic scattering and excitation of inner-shell electrons. The energy loss is measured and analyzed to gain information about the sample's composition, electronic structure, and bonding characteristics. By studying the energy loss spectrum, researchers can identify the types of atoms present in the sample, determine their chemical states, and gather insights into the electronic properties of the material. EELS is particularly useful for investigating nanoscale materials, thin films, and interfaces, providing valuable information about their electronic and atomic structure. It is a powerful technique for understanding the behavior of materials at the nanometer scale and plays a significant role in advancing fields such as materials science, nanotechnology, and semiconductor research.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Spectroscopy c

Electron Microprobec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronMicroprobe

An analytical instrument used to determine the chemical composition of materials.

Is defined by
https://w3id.org/pmd/mo
has super-classes
electron microscope c
has sub-classes
Electron Probe Micro Analyzer c

Electron Probec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronProbe

The focused electron beam used for imaging or analysis in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Beam c

Electron Probe Micro Analyzerc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronProbeMicroAnalyzer

An instrument used for elemental analysis of solid materials by bombarding them with a focused electron beam.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Electron Microprobe c

Electron Tomographc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronTomograph

An instrument used for tomographic imaging using electrons.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Transmission Electron Microscope c

Electron Tomographyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ElectronTomography

Electron Tomography is a technique that involves collecting a series of transmission electron microscopy (TEM) images from different angles to reconstruct a three-dimensional image of a sample.

Is defined by
https://w3id.org/pmd/mo
has super-classes
transmission electron microscopy c
has sub-classes
Cryo Electron Tomography c

Emission Currentc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EmissionCurrent

Der Emissionsstrom wird normalerweise in Mikroampere (μA) oder Milliampere (mA) gemessen.

The current of electrons emitted from the electron source.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Current c

Energyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Energy

The energy is usually measured in joules (J) or electron volts (eV).

The capacity of a physical system to perform work.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c
has sub-classes
Beam Energy c, Energy Loss c

Energy Dispersive X-ray Spectroscopyc back to ToC or Class ToC

energiedispersive Röntgenanalysec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EnergyDispersiveXRaySpectroscopy

Energy Dispersive X-ray Spectroscopy is a technique used to analyze the elemental composition of a sample by detecting the X-rays emitted when the sample is bombarded with electrons in an electron microscope or other instrument. EDS provides information about the elements present in the sample and their relative concentrations.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Spectroscopy c, X-ray Microanalysis c

Energy Filterc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EnergyFilter

An Energy Filter is a device used in electron microscopy to filter electrons by their energy, improving image quality and enabling specific analytical techniques.

Source
ChatGPT 3.5
has super-classes
Optical Element c
has sub-classes
CEOS-CEFID Filter c, Gatan Image Filter c

Energy Lossc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EnergyLoss

The loss of energy experienced by a particle as it passes through a medium.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Energy c

Energy Resolutionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EnergyResolution

The ability of a detector to distinguish between different energy levels of incident radiation.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Resolution c

Energy-filtered Transmission Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EnergyFilteredTransmissionElectronMicroscope

A transmission electron microscope equipped with an energy filter to select electrons of specific energy levels.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Transmission Electron Microscope c

Environmental Scanning Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EnvironmentalScanningElectronMicroscope

A type of electron microscope that can image non-conductive samples in their natural state.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Electron Microscope c

Environmental Scanning Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EnvironmentalScanningElectronMicroscopy

Environmental Scanning Electron Microscopy is a technique that allows imaging of samples in a gaseous environment. It is particularly useful for observing hydrated or non-conductive samples without the need for extensive sample preparation.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Electron Microscopy c

Environmental Transmission Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/EnvironmentalTransmissionElectronMicroscopy

Environmental Transmission Electron Microscopy allows imaging and analysis of materials in controlled gaseous environments, simulating real-world conditions.

Is defined by
https://w3id.org/pmd/mo
has super-classes
transmission electron microscopy c

Exposure Timec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ExposureTime

The duration for which the imaging sensor is exposed to light, measured in seconds (s).

Is defined by
https://w3id.org/pmd/mo
has super-classes
duration c

Extraction Voltagec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ExtractionVoltage

The voltage applied to the electron source in an electron microscope to extract electrons from the cathode and accelerate them towards the specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Voltage c

Field Emission Gunc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FieldEmissionGun

A Field Emission Gun is an electron gun used in electron microscopes to produce an electron beam with extremely high brightness and coherence. It relies on the phenomenon of field emission, where electrons are emitted from a sharp emitter tip under the influence of a strong electric field. FEGs are capable of producing highly focused electron beams, leading to enhanced imaging resolution and analytical capabilities.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Gun c

Field Emission Scanning Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FieldEmissionScanningElectronMicroscopy

Field Emission Scanning Electron Microscopy is an advanced form of SEM that uses a field emitter to produce a highly focused electron beam, enabling high-resolution imaging and surface analysis.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Electron Microscopy c

Field Ion Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FieldIonMicroscope

A type of microscope that uses the phenomenon of field ionization to image surfaces with atomic resolution.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Ion Microscope c

Field Ion Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FieldIonMicroscopy

Field Ion Microscopy is a specialized microscopy technique that uses a strong electric field to ionize atoms on the surface of a metal sample. These ionized atoms are then repelled from the surface and can be detected to create an image of the sample's surface topography at atomic resolution. FIM is especially powerful for imaging the arrangement of atoms on metallic surfaces.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Ion Microscopy c

Field Widthc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FieldWidth

Field Width refers to the horizontal extent of the observable field in an electron microscope.

Source
ChatGPT 3.5
has super-classes
width
has sub-classes
Horizontal Field Width c, Vertical Field Width c

Filamentc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Filament

A thin wire or thread that emits electrons when heated in a vacuum tube or electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
component c

Filament Currentc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FilamentCurrent

The current passing through the filament of the electron gun in an electron microscope, which heats up the filament to emit electrons.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Current c

Fluorescence Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FluorescenceMicroscopy

Fluorescence Microscopy is an optical imaging technique used to visualize biological structures and molecules that fluoresce when illuminated with specific wavelengths of light. Fluorescent molecules absorb light energy and then emit light of a longer wavelength, allowing the visualization of specific molecules or cellular components. Fluorescence microscopy is widely used in cell biology, molecular biology, and medical research.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Light Microscopy c

Flyback Timec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FlybackTime

The time taken for the electron beam to return to its starting position after scanning a line or frame in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
duration c

Focal Lengthc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FocalLength

The distance between the focal point (where the electron beam is focused) and the lens or aperture in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
length c

Focal Planec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FocalPlane

The plane perpendicular to the optical axis of an electron microscope where the electron beam is focused to form an image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
area c

Focal Pointc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FocalPoint

The point at which the electron beam is focused in an electron microscope to form an image of the specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
digital entity c

Focus(ed) Ion Beam - Scanning Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FocusedIonBeam-ScanningElectronMicroscope

A dual-beam microscope that combines a focused ion beam with a scanning electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Ion Microscope c
has sub-classes
Helium Ion Microscope c

Focused Beamc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FocusedBeam

An electron beam that has been narrowed or focused to a small spot size on the specimen surface.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Beam c

Focused Ion Beam Scanning Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FocusedIonBeamScanningElectronMicroscopy

Focused Ion Beam Scanning Electron Microscopy is a combination of two techniques: focused ion beam (FIB) and scanning electron microscopy (SEM). FIB-SEM systems use a focused ion beam to both image and modify a sample's surface. The ion beam can be used for milling, cutting, and deposition processes, making FIB-SEM a versatile tool for materials analysis, sample preparation, and three-dimensional imaging.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Ion Microscopy c

Fourier Transform Infrared Spectroscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FourierTransformInfraredSpectroscopy

Fourier Transform Infrared Spectroscopy (FTIR) is a powerful analytical technique used in various scientific disciplines to study the molecular composition and properties of materials. It is based on the interaction between infrared radiation and a sample, providing information about the vibrational modes of molecules. In FTIR spectroscopy, an infrared beam is directed through a sample, and the interaction between the radiation and the sample's molecules leads to absorption of specific infrared frequencies. Each type of molecular bond and functional group in the sample absorbs infrared radiation at characteristic frequencies, which correspond to the energies of molecular vibrations. The resulting absorption spectrum represents a fingerprint of the sample's molecular structure. The Fourier transform technique is used to convert the raw data obtained from the absorption measurements into a Fourier-transformed spectrum. This transformation improves the signal-to-noise ratio and enhances the accuracy of spectral analysis. FTIR is extensively used in a wide range of fields, including chemistry, biology, materials science, pharmaceuticals, and environmental science. It is employed for qualitative and quantitative analysis, identification of compounds, monitoring chemical reactions, and studying molecular interactions. FTIR spectroscopy provides valuable insights into molecular bonding, functional groups, and the chemical composition of substances, making it an indispensable tool in modern analytical science.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Spectroscopy c

Framec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Frame

A single image or capture in a sequence of images.

Is defined by
https://w3id.org/pmd/mo
has super-classes
digital entity c

Frame Countc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FrameCount

The total number of frames or images in a sequence.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Frame Timec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/FrameTime

The time required to capture and display a single frame of an image in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
duration c

Gammac back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Gamma

The nonlinear operation used to encode and decode luminance or color values in an image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Gatan Image Filterc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/GatanImageFilter

A Gatan Image Filter refers to an image filter manufactured by Gatan, Inc., a company specializing in electron microscopy and related products. Gatan's image filters are designed for electron microscopes and electron energy loss spectroscopy (EELS) applications. These filters allow researchers to control and enhance the acquisition of electron energy loss spectra while obtaining high-resolution images of the sample under investigation.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Energy Filter c, Image Filter c

Grid Voltagec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/GridVoltage

Grid Voltage refers to the voltage applied to the control grid in an electron microscope, which influences the electron beam's focus and intensity.

Source
ChatGPT 3.5
has super-classes
Voltage c

Gunc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Gun

In the context of electron microscopy and particle acceleration, a "gun" typically refers to an electron or particle source that generates and emits the particles. In electron microscopy, an electron gun is used to generate a beam of electrons for imaging or analysis. In particle accelerators, a particle gun generates and launches particles at high speeds for various experimental purposes.

Is defined by
https://w3id.org/pmd/mo
is equivalent to
component some Source c
has super-classes
processing node c
has sub-classes
Field Emission Gun c, Schottky Emission Gun c, Thermionic Emission Gun c

Gun Vacuumc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/GunVacuum

The vacuum level inside the electron gun of an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Vacuum c

Helium Ion Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/HeliumIonMicroscope

A type of microscope that uses helium ions to image samples with high resolution.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Focus(ed) Ion Beam - Scanning Electron Microscope c

Helium Ion Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/HeliumIonMicroscopy

Helium Ion Microscopy is a microscopy technique that uses a beam of helium ions instead of electrons to interact with a sample's surface. The smaller mass of helium ions compared to electrons allows for higher resolution imaging and reduced sample damage. HIM provides high-resolution images and is often used for imaging delicate or sensitive samples.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Ion Microscopy c

High Resolution Transmission Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/HighResolutionTransmissionElectronMicroscope

A transmission electron microscope capable of achieving high-resolution images.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Transmission Electron Microscope c

High Resolution Transmission Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/HighResolutionTransmissionElectronMicroscopy

High Resolution TEM is a technique that provides exceptionally high-resolution images of a sample's internal structure, revealing atomic-level details.

Is defined by
https://w3id.org/pmd/mo
has super-classes
transmission electron microscopy c

High-angle Annular Dark-field Scanning Transmission Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/HighAngleAnnularDarkFieldScanningTransmissionElectronMicroscope

A type of scanning transmission electron microscope that detects scattered electrons at high angles.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Transmission Electron Microscope c

Holderc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Holder

A device used to support or secure a specimen or component in place.

Is defined by
https://w3id.org/pmd/mo
has super-classes
component c

Horizontal Field Widthc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/HorizontalFieldWidth

Horizontal Field Width refers to the horizontal extent of the observable field in an electron microscope.

Source
ChatGPT 3.5
has super-classes
Field Width c

Image Filterc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ImageFilter

An image filter is a device or component used in imaging systems, such as microscopy or photography, to modify the appearance of an image by selectively altering certain characteristics. Filters can be used to adjust contrast, brightness, color balance, and other image properties. They are often used to enhance specific features or to correct for distortions caused by lighting conditions or optical imperfections.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Optical Element c
has sub-classes
CEOS-CEFID Filter c, Gatan Image Filter c

Image Namec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ImageName

The designated name or title for an image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
identifier c

Image Pathc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/IMAGEPATH

The location or directory path where an image file is stored.

Is defined by
https://w3id.org/pmd/mo
has super-classes
identifier c

Image Size X-Axisc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ImageSizeXAxis

The size of the image along the X-axis.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Image Size Y-Axisc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ImageSizeYAxis

The size of the image along the Y-axis.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Incident Beamc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/IncidentBeam

The electron beam that strikes the specimen surface in an electron microscope, causing interactions that produce signals for imaging or analysis.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Beam c

Indicated Magnificationc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/IndicatedMagnification

Indicated Magnification refers to the magnification level shown by the instrument's controls or display in an electron microscope.

Source
ChatGPT 3.5
has super-classes
Magnification c

Inelastic Scatteringc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/InelasticScattering

Inelastic scattering is a scattering process that involves the transfer of energy and momentum between the incident particle (e.g., photon, electron) and the target particle. During inelastic scattering, the energy of the scattered particle changes, and the interaction may result in various outcomes, such as excitation, emission, or other energy transfers that alter the internal state of the target particle.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Physical Process c

Interaction Volumec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/InteractionVolume

The region within a sample where a particle beam interacts with the material.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Volume c

Intermediate Lensc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/IntermediateLense

A lens that is positioned between the objective lens and the projector lens in an optical system.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Lens c

Ion Beamc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/IonBeam

A stream of ions used for grinding or analysis, especially in ion microscopy techniques for imaging.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Beam c

Ion Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/IonMicroscope

A microscope that uses ions to create images of samples.

Is defined by
https://w3id.org/pmd/mo
has super-classes
micropscope c
has sub-classes
Field Ion Microscope c, Focus(ed) Ion Beam - Scanning Electron Microscope c

Ion Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/IonMicroscopy

Ion Microscopy refers to a group of microscopy techniques that use focused ion beams to image and analyze samples. These techniques utilize ions, such as protons or heavy ions, instead of electrons or photons to interact with the sample, providing valuable information about its composition and structure.

Is defined by
https://w3id.org/pmd/mo
has super-classes
microscopy process c
has sub-classes
Field Ion Microscopy c, Focused Ion Beam Scanning Electron Microscopy c, Helium Ion Microscopy c

Lensc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Lense

A piece of optical glass or other transparent material used to focus or magnify light in optical instruments.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Optical Element c
has sub-classes
Condensor Lens c, Intermediate Lens c, Objective Lens c, Projector Lens c

Light Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/LightMicroscope

An optical microscope that uses visible light to illuminate and magnify samples.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Optical Microscope c
has sub-classes
Polarized Light Microscope c

Light Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/LightMicroscopy

The use of visible light to observe and study small objects or structures.

Is defined by
https://w3id.org/pmd/mo
has super-classes
optical microscopy c
has sub-classes
Confocal Laser Scanning Microscopy c, Fluorescence Microscopy c, Polarized Light Microscopy c

Magnificationc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Magnification

The process of enlarging the appearance of an image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c
has sub-classes
Actual Magnification c, Indicated Magnification c

Maximum Exposurec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/MaximumExposure

The maximum duration for which the imaging sensor can be exposed to light, measured in seconds.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Mechanical Polishingc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/MechanicalPolishing

Mechanical polishing is a material preparation technique used to enhance the surface quality and finish of a sample by removing thin layers of material through abrasion. It involves using abrasive materials, such as polishing cloths, diamond suspensions, or abrasive pastes, along with a polishing machine or device. The process typically includes several steps, each using progressively finer abrasives to achieve a smooth and mirror-like surface.

During mechanical polishing, the sample is pressed against the rotating polishing medium with controlled pressure. The abrasive particles embedded in the medium gradually remove surface irregularities, scratches, and imperfections, resulting in improved flatness, clarity, and reflectivity. The process can be adjusted to target specific levels of surface roughness and precision.

Mechanical polishing is commonly used in various scientific and industrial applications, such as metallography, materials science, electronics, and optics. It is an essential step before further analyses like microscopy, spectroscopy, or surface profiling, as it provides a pristine surface for accurate characterization and observation of material properties.

Is defined by
https://w3id.org/pmd/mo
has super-classes
manufacturing process c

Monochromatic Beamc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/MonochromaticBeam

An electron beam consisting of electrons with a narrow range of energies, typically achieved using electron energy filters or monochromators.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Beam c

Monochromatorc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Monochromator

An optical device that transmits a narrow range of wavelengths of light.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Optical Element c

Objective Aperturec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ObjectiveAperture

An aperture in the objective lens system of a microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Aperture c

Objective Lensc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ObjectiveLense

A lens in a microscope or similar optical device that is closest to the specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Lens c

Optical Elementc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/OpticalElement

An Optical Element is a component of an optical system that affects the propagation of light, such as lenses, mirrors, or prisms.

Source
ChatGPT 3.5
has super-classes
processing node c
has sub-classes
Energy Filter c, Image Filter c, Lens c, Monochromator c, Pole Piece c

Optical Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/OpticalMicroscope

A microscope that uses visible light and lenses to magnify specimens.

Is defined by
https://w3id.org/pmd/mo
has super-classes
micropscope c
has sub-classes
Light Microscope c

Orientation Imaging Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/OrientationImagingMicroscopy

Orientation Imaging Microscopy is a microscopy technique used to map the crystallographic orientations of grains within a material. It is commonly applied in SEM to study the microstructural properties of polycrystalline materials.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Electron Microscopy c

Palettec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Palette

In computer graphics, a palette is the set of available colors from which an image can be made. In some systems, the palette is fixed by the hardware design, and in others it is dynamic, typically implemented via a color lookup table (CLUT), a correspondence table in which selected colors from a certain color space's color reproduction range are assigned an index, by which they can be referenced.

Is defined by
https://w3id.org/pmd/mo
Example
Typical colorscales may be, e.g., greyscale, RGB, or CMYK.
has super-classes
value object c

Physical Processc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/PhysicalProcess

A physical process refers to a sequence of events or interactions that occur in the physical world and can be described and analyzed based on the principles of physics. These processes involve the transformation of energy, matter, or both, and they often follow established laws and theories of physics. In particular, a physical process may just occur due to natural circumstances and does not necessarily have to be induced by human activities or interactions.

Is defined by
https://w3id.org/pmd/mo
has super-classes
process c
has sub-classes
Diffraction c, Inelastic Scattering c

Pixel Sizec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/PixelSize

The size of individual pixels in a digital image or display.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Polarized Light Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/PolarizedLightMicroscope

A microscope that uses polarized light to observe and analyze samples.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Light Microscope c

Polarized Light Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/PolarizedLightMicroscopy

Polarized Light Microscopy is a technique that uses polarized light to enhance the contrast and reveal structural information in transparent samples. Light waves vibrate in specific directions, and by using polarizers to control the orientation of light waves, polarized light microscopy can highlight birefringent materials, anisotropic structures, and stress patterns within samples. This technique is valuable for studying crystalline structures, fibers, and anisotropic materials.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Light Microscopy c

Pole Piecec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/PolePiece

A component of the electron column in an electron microscope that focuses and guides the electron beam onto the specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Optical Element c

Precession Electron Diffractionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/PrecessionElectronDiffraction

Precession Electron Diffraction is a technique used in electron microscopy where the electron beam is tilted in a precession motion, improving the quality of diffraction patterns and reducing dynamical effects.

Source
ChatGPT 3.5
has super-classes
Electron Diffraction c

Pressurec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Pressure

The force exerted per unit area in a system, typically measured in pascals or other units.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Primary Beamc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/PrimaryBeam

The main electron beam emitted from the electron source and directed towards the specimen in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Beam c

Probe Currentc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ProbeCurrent

The current in the probe is typically measured in nanoamperes (nA).

The current of electrons in the focused electron beam used for imaging or analysis in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Current c

Probe Sizec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ProbeSize

The size of the probe or beam used in microscopy or spectroscopy techniques. It is typically measured in nanometers (nm).

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Projector Lensc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ProjectorLense

A lens used to project the image from the intermediate lens onto a viewing screen or detector.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Lens c

Readout Timec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ReadoutTime

The time taken to read out data from a sensor, typically measured in nanoseconds (ns).

Is defined by
https://w3id.org/pmd/mo
has super-classes
time c

Reconstructionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Reconstruction

The process of creating a three-dimensional image or model from two-dimensional data.

Is defined by
https://w3id.org/pmd/mo
has super-classes
analysing process c
has sub-classes
Three dimensional reconstruction c, Tomographic Reconstruction c

Resolutionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Resolution

In various contexts, resolution refers to the degree of detail that can be discerned in an image, measurement, or other representation of an object or phenomenon.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c
has sub-classes
Atomic Resolution c, Energy Resolution c, Spatial Resolution c, Temporal Resolution c

Rotation Anglec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/RotationAngle

The angle by which an object is rotated around a specific axis.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Angle c

Scan Ratec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanRate

The speed at which data is scanned or recorded.

Is defined by
https://w3id.org/pmd/mo
has super-classes
testing rate c

Scanning Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningElectronMicroscope

A microscope that produces images of a sample by scanning it with a focused beam of electrons.

Is defined by
https://w3id.org/pmd/mo
has super-classes
electron microscope c
has sub-classes
Cryo Scanning Electron Microscope c, Environmental Scanning Electron Microscope c

Scanning Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningElectronMicroscopy

Scanning Electron Microscopy is a microscopy technique that uses a focused beam of electrons to scan the surface of a sample. The interaction of the electrons with the sample generates signals that provide information about the sample's topography, morphology, and composition.

Is defined by
https://w3id.org/pmd/mo
has super-classes
electron microscopy c
has sub-classes
Atmospheric Scanning Electron Microscopy c, Electron Channeling Contrast Imaging c, Environmental Scanning Electron Microscopy c, Field Emission Scanning Electron Microscopy c, Orientation Imaging Microscopy c

Scanning Probe Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningProbeMicroscope

A type of microscope that images surfaces by scanning a probe over the sample.

Is defined by
https://w3id.org/pmd/mo
has super-classes
electron microscope c
has sub-classes
Scanning Tunneling Microscope c

Scanning Probe Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningProbeMicroscopy

Scanning Probe Microscopy encompasses various techniques, such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), that use a sharp probe to scan a sample's surface. These techniques provide high-resolution images and information about surface properties on the nanometer scale.

Is defined by
https://w3id.org/pmd/mo
has super-classes
electron microscopy c
has sub-classes
Scanning Tunneling Microscopy c

Scanning Transmission Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningTransmissionElectronMicroscope

A type of transmission electron microscope where a focused electron beam is scanned across the sample.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Transmission Electron Microscope c
has sub-classes
High-angle Annular Dark-field Scanning Transmission Electron Microscope c

Scanning Transmission Electron Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningTransmissionElectronMicroscopy

Scanning Transmission Electron Microscopy is a technique that combines the principles of scanning and transmission electron microscopy. It allows imaging and spectroscopy with high spatial resolution.

Is defined by
https://w3id.org/pmd/mo
has super-classes
transmission electron microscopy c
has sub-classes
4D Scanning Transmission Electron Microscopy c, Annular Bright Field Scanning Transmission Electron Microscopy c, Annular Dark Field Scanning Transmission Electron Microscopy c, Scanning Transmission Electron Microscopy Electron Energy Loss Spectroscopy c

Scanning Transmission Electron Microscopy Electron Energy Loss Spectroscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningTransmissionElectronMicroscopy-ElectronEnergyLossSpectroscopy

STEM-EELS combines STEM imaging with electron energy loss spectroscopy to provide information about the elemental composition and electronic structure of a sample at high spatial resolution.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Transmission Electron Microscopy c

Scanning Tunneling Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningTunnelingMicroscope

A microscope that uses quantum tunneling to image surfaces at the atomic level.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Probe Microscope c

Scanning Tunneling Microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ScanningTunnelingMicroscopy

Scanning Tunneling Microscopy is a technique that uses a conducting probe to measure the tunneling current between the probe and the sample's surface. It provides atomic-scale images of surfaces and is often used to study conductive materials.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Scanning Probe Microscopy c

Schottky Emission Gunc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SchottkyEmissionGun

A Schottky Emission Gun is a device in electron microscopes that produces electrons by field-induced thermionic emission, using a Schottky emitter.

Source
ChatGPT 3.5
has super-classes
Gun c

Scintillatorc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Scintillator

A material that emits light when it absorbs ionizing radiation.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Detector c

Secondary Ion Mass Spectrometryc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SecondaryIonMassSpectrometry

Secondary Ion Mass Spectrometry (SIMS) is an advanced analytical technique used to determine the elemental and isotopic composition of solid surfaces and thin films at a very high sensitivity and spatial resolution. It is widely employed in various scientific and industrial applications, including materials science, semiconductor research, and surface analysis. In SIMS, a focused beam of high-energy primary ions is directed at a sample's surface. The impact of these primary ions causes the ejection of secondary ions from the sample's surface. These secondary ions are then extracted, mass-separated, and detected using a mass spectrometer. The mass spectrometer measures the mass-to-charge ratios of the secondary ions, providing information about the elemental and isotopic composition of the sample. The sensitivity and spatial resolution of SIMS allow researchers to analyze very small areas, often down to the micrometer or nanometer scale. This makes SIMS particularly valuable for investigating surface composition, depth profiling of layered structures, and detecting trace elements in complex materials. The technique is non-destructive in its elemental analysis, which is beneficial for studying delicate samples or preserving valuable materials. SIMS has applications in diverse fields, including materials characterization, semiconductor device analysis, biological and medical research, and geological studies. It provides essential information about the chemical composition, structure, and distribution of elements in complex samples, contributing to advancements in materials science and various technological developments.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Spectroscopy c

Selected Area Electron Diffractionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SelectedAreaElectronDiffraction

Selected Area Electron Diffraction is a technique used in transmission electron microscopy (TEM) to study the crystallographic orientation of small regions within a sample. By selecting a specific area of the sample and directing an electron beam onto it, diffraction patterns are generated. These patterns offer insights into the sample's crystal structure and orientation.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Electron Diffraction c

Sharpnessc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Sharpness

The quality of being clear and well-defined in an image or specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Silicon Drift Detectorc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SiliconDriftDetector

A type of X-ray detector that offers high-speed performance and high energy resolution.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Detector c

Soft X-ray Emission Spectrometerc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SoftXRayEmissionSpectrometer

An instrument used to analyze the emission of soft X-rays from a sample.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Spectrometer c

Sourcec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Source

The electron source, such as a tungsten filament or field-emission cathode, that emits electrons in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
processing node c

Spatial Resolutionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SpatialResolution

The ability of an imaging system to discern fine details in an object. It refers to the smallest discernible detail in an image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Resolution c

Spectrometerc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Spectrometer

An instrument used to measure properties of light over a specific portion of the electromagnetic spectrum.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Detector c
has sub-classes
Electron Energy Loss Spectrometer c, Soft X-ray Emission Spectrometer c, X-ray Energy Dispersive Spectrometer c

Spectroscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Spectroscopy

Spectroscopy is a scientific technique used to study and analyze the interaction of matter with electromagnetic radiation, such as light. It involves measuring the way in which different substances absorb, emit, or scatter light at various wavelengths or frequencies. By examining the spectrum of light emitted, absorbed, or transmitted by a sample, scientists can gain insights into its chemical composition, molecular structure, and physical properties. Spectroscopy is widely utilized in various fields, including chemistry, physics, astronomy, and biochemistry, to investigate the characteristics and behavior of materials at the atomic and molecular level.

Is defined by
https://w3id.org/pmd/mo
has super-classes
analysing process c
has sub-classes
Auger Electron Spectroscopy c, Electron Energy Loss Spectroscopy c, Energy Dispersive X-ray Spectroscopy energiedispersive Röntgenanalyse c, Fourier Transform Infrared Spectroscopy c, Secondary Ion Mass Spectrometry c, Time Of Flight Secondary Ion Mass Spectrometry c, X-ray Absorption Near Edge Spectroscopy c

Spherical Aberrationc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SphericalAberration

A type of optical aberration caused by deviations from the ideal spherical shape in lenses or mirrors.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Aberration c

Spotc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Spot

Spot refers to the focused point of the electron beam in an electron microscope, where the beam interacts with the specimen.

Source
ChatGPT 3.5
has super-classes
object c

Spot Sizec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SpotSize

Spot Size refers to the diameter of the electron beam at the point where it is focused on the specimen in an electron microscope.

Source
ChatGPT 3.5
has super-classes
value object c

Stagec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Stage

A platform or support used to hold and position a specimen in a microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
component c

Stigmation Xc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/StigmationX

The adjustment of astigmatism in the X-axis of an electron beam in microscopy.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Stigmation Yc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/StigmationY

The adjustment of astigmatism in the Y-axis of an electron beam in microscopy.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Stigmatorc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Stigmator

A device in electron microscopy used to correct astigmatism in the electron beam.

Is defined by
https://w3id.org/pmd/mo
has super-classes
processing node c

Surface Structurec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SurfaceStructure

The arrangement and features of the outermost layer of a material.

Is defined by
https://w3id.org/pmd/mo
has super-classes
object c

System Vacuumc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/SystemVacuum

The overall vacuum level in the entire system of an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Vacuum c

Temporal Resolutionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/TemporalResolution

Temporal Resolution is the ability of a microscopy or imaging system to distinguish between events or changes occurring at different times, critical in capturing dynamic processes.

Source
ChatGPT 3.5
has super-classes
Resolution c

Thermionic Emission Gunc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ThermionicEmissionGun

A Thermionic Emission Gun is a device in electron microscopes that produces electrons by heating a filament to emit electrons through thermionic emission.

Source
ChatGPT 3.5
has super-classes
Gun c

Thin Foil Aperturec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/ThinFoilAperture

An aperture used in electron microscopy to control the electron beam passing through a thin foil specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Aperture c

Three dimensional reconstructionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/3DReconstruction

The process of creating a three-dimensional representation of an object or scene from two-dimensional images or data.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Reconstruction c

Thresholdc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Threshold

A value or limit at which a specific effect or result occurs.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c

Tilt Anglec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/TiltAngle

The angle at which an object is tilted from its vertical or horizontal position.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Angle c

Tilt Correctionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/TiltCorrection

A correction applied to images obtained from tilted specimens in electron microscopy to compensate for distortions caused by the tilt angle.

Is defined by
https://w3id.org/pmd/mo
has super-classes
analysing process c

Time Of Flight Secondary Ion Mass Spectrometryc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/TimeOfFlightSecondaryIonMassSpectrometry

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is an advanced surface analysis technique used to determine the elemental and molecular composition of solid surfaces and thin films with high sensitivity and spatial resolution. It is employed in various scientific and industrial fields, including materials science, nanotechnology, biomedicine, and semiconductor research. TOF-SIMS builds upon the principles of Secondary Ion Mass Spectrometry (SIMS), where a focused beam of high-energy primary ions is directed at a sample's surface, causing the ejection of secondary ions. In TOF-SIMS, the flight time of these secondary ions is measured as they travel through a field-free region and enter a time-of-flight mass spectrometer. The mass spectrometer measures the time taken by the ions to reach the detector, which is directly proportional to their mass-to-charge ratio. By analyzing the flight times of the secondary ions, TOF-SIMS can determine the elemental, isotopic, and molecular composition of the sample's surface. It provides information about the presence of specific elements, chemical compounds, and molecular fragments, along with their spatial distribution. The high sensitivity of TOF-SIMS allows for the detection of trace elements and molecular species in complex samples. TOF-SIMS is valuable for characterizing surfaces at the nanoscale, profiling layered structures, investigating organic and inorganic materials, and studying biological specimens. Its ability to provide detailed chemical information while maintaining spatial resolution makes it an essential tool for understanding surface properties and material interactions in a wide range of applications.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Spectroscopy c

Tomographic Reconstructionc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/TomographicReconstruction

The process of reconstructing a three-dimensional structure from a series of two-dimensional images taken at different angles.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Reconstruction c

Transmission Electron Aberration-corrected Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/TransmissionElectronAberrationCorrectedMicroscope

A transmission electron microscope equipped with aberration correction to achieve high-resolution imaging.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Transmission Electron Microscope c

Transmission Electron Microscopec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/TransmissionElectronMicroscope

A microscope that transmits a beam of electrons through a specimen, forming an image.

Is defined by
https://w3id.org/pmd/mo
has super-classes
electron microscope c
has sub-classes
Cryo Transmission Electron Microscope c, Electron Tomograph c, Energy-filtered Transmission Electron Microscope c, High Resolution Transmission Electron Microscope c, Scanning Transmission Electron Microscope c, Transmission Electron Aberration-corrected Microscope c

transmission electron microscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/TransmissionElectronMicroscopy

Transmission Electron Microscopy is a microscopy technique that involves transmitting a beam of electrons through a thin sample to create high-resolution images. It is used to study the internal structure and morphology of materials at the nanometer scale.

Is defined by
https://w3id.org/pmd/mo
has super-classes
electron microscopy c
has sub-classes
Bright Field Transmission Electron Microscopy c, Dynamic Transmission Electron Microscopy c, Electron Tomography c, Environmental Transmission Electron Microscopy c, High Resolution Transmission Electron Microscopy c, Scanning Transmission Electron Microscopy c

Vacuumc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Vacuum

A space entirely devoid of matter, or where the pressure is significantly lower than atmospheric pressure.

Is defined by
https://w3id.org/pmd/mo
has super-classes
object c
has sub-classes
Chamber Vacuum c, Gun Vacuum c, System Vacuum c

Vacuum Pumpc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/VacuumPump

A Vacuum Pump is a device used in electron microscopes to evacuate air from the chamber, creating the necessary vacuum conditions for electron beam operation.

Source
ChatGPT 3.5
has super-classes
processing node c

Vertical Field Widthc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/VerticalFieldWidth

Vertical Field Width refers to the vertical extent of the observable field in an electron microscope.

Source
ChatGPT 3.5
has super-classes
Field Width c

Voltagec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Voltage

Voltage is measured in volts (V) and typically represented in kilovolts (kV), and it represents the potential energy difference between two points in a circuit. The higher the voltage, the greater the force pushing the electric charges, and consequently, the higher the potential for current to flow.

Voltage, also known as electric potential difference, is a measure of the electric potential energy per unit charge in an electrical circuit. It is the force or pressure that drives electric current through a conductor.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c
has sub-classes
Acceleration Voltage c, Extraction Voltage c, Grid Voltage c

Volumec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/Volume

The amount of space that a substance or object occupies.

Is defined by
https://w3id.org/pmd/mo
has super-classes
value object c
has sub-classes
Interaction Volume c

Wait Timec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/WaitTime

The wait time is often used to allow the specimen to stabilize or to minimize sample damage.

The time interval between successive measurements or operations in an electron microscope.

Is defined by
https://w3id.org/pmd/mo
has super-classes
duration c

Working Distancec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/WorkingDistance

The working distance affects the depth of field and the resolution of the image. Usually, the working distance is specified in millimeters (mm).

The distance between the electron microscope objective lens and the specimen surface when the electron beam is focused on the specimen.

Is defined by
https://w3id.org/pmd/mo
has super-classes
distance c

X-ray Absorption Near Edge Spectroscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XRayAbsorptionNearEdgeSpectroscopy

X-ray Absorption Near Edge Spectroscopy (XANES) is a specialized technique used in the field of materials science and spectroscopy to study the electronic and structural properties of materials. It focuses on the X-ray absorption spectra of atoms within a sample, particularly the region just above the absorption edge of an element's X-ray absorption spectrum. In XANES, a sample is irradiated with X-rays, typically generated by a synchrotron radiation source. These X-rays are tuned to specific energy levels corresponding to the absorption edges of the elements of interest in the sample. As the X-rays are absorbed by the sample, the energy levels of the atoms are altered, leading to various transitions in their electron configurations. The resulting X-ray absorption spectrum is measured, specifically targeting the energies just above the absorption edge. XANES provides information about the electronic structure of the atoms within the sample, including the oxidation state, chemical bonding, and local environment of the absorbing element. The fine details of the XANES spectrum offer insights into the atomic and molecular interactions, as well as the coordination and symmetry of atoms in different chemical environments. This technique is widely used in various scientific fields, including chemistry, solid-state physics, and materials science. XANES helps researchers understand the properties and behavior of materials at the atomic level, making it an invaluable tool for investigating the characteristics of complex materials, catalysts, minerals, and biomolecules.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Spectroscopy c

X-ray Absorption Spectroscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XRayAbsorptionSpectroscopy

X-ray Absorption Spectroscopy is a technique used to study the electronic and local structural properties of materials by analyzing the absorption of X-rays. It involves measuring how X-rays are absorbed by a sample at various energies, providing insights into the electronic states and chemical environments of specific elements.

Is defined by
https://w3id.org/pmd/mo
has super-classes
X-ray Mapping c

X-ray Analysisc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XRayAnalysis

X-ray analysis is a technique used to investigate the composition and structure of materials by exposing them to X-rays. When X-rays interact with a material, they can be absorbed, scattered, or diffracted in ways that provide information about the material's internal arrangement of atoms and its elemental composition.

Is defined by
https://w3id.org/pmd/mo
has super-classes
analysing process c
has sub-classes
X-ray Mapping c, X-ray Microanalysis c

X-ray Diffractionc back to ToC or Class ToC

Röntgenbeugungc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XRayDiffraction

X-ray Diffraction is a technique that utilizes the diffraction of X-rays by crystals to determine their atomic arrangement and lattice structure. X-ray diffraction patterns are produced when X-rays strike a crystalline sample, and the resulting pattern provides information about the arrangement of atoms in the crystal lattice.

Is defined by
https://w3id.org/pmd/mo
has super-classes
Diffraction c

X-ray Energy Dispersive Spectrometerc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XrayEnergyDispersiveSpectrometer

An X-ray Energy Dispersive Spectrometer is a device used in electron microscopes to analyze the elemental composition of samples by detecting X-rays emitted from the sample.

Source
ChatGPT 3.5
is equivalent to
has function some Energy Filter c
has function some Image Filter c
has super-classes
Spectrometer c

X-ray Fluorescencec back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XRayFluorescence

X-ray Fluorescence is a method used to determine the elemental composition of a sample by analyzing the X-rays emitted when the sample is exposed to high-energy X-rays. The X-rays emitted are characteristic of the elements present, allowing for quantitative analysis of the sample's elemental composition.

Is defined by
https://w3id.org/pmd/mo
has super-classes
X-ray Mapping c

X-ray Mappingc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XRayMapping

X-ray mapping is a process that involves generating spatially resolved images of the distribution of specific elements within a sample. By collecting X-ray signals emitted or scattered from a sample at different points, an elemental map can be created, showing the varying concentrations of elements across the sample's surface.

Is defined by
https://w3id.org/pmd/mo
has super-classes
X-ray Analysis c
has sub-classes
X-ray Absorption Spectroscopy c, X-ray Fluorescence c, X-ray Photoelectron Spectroscopy c

X-ray Microanalysisc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XRayMicroanalysis

X-ray Microanalysis is a technique that combines microscopy and X-ray analysis to study the elemental composition of small regions within a sample. It involves focusing an electron or X-ray beam on a specific area of the sample and measuring the X-rays emitted from that area to determine the elemental composition.

Is defined by
https://w3id.org/pmd/mo
has super-classes
X-ray Analysis c
has sub-classes
Energy Dispersive X-ray Spectroscopy energiedispersive Röntgenanalyse c

X-ray Photoelectron Spectroscopyc back to ToC or Class ToC

IRI: https://w3id.org/pmd/mo/XRayPhotoelectronSpectroscopy

X-ray Photoelectron Spectroscopy, also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a technique used to study the surface chemistry of materials. XPS involves bombarding a sample's surface with X-rays to emit photoelectrons, which are then analyzed to determine the elemental composition and chemical states of the elements on the surface.

Is defined by
https://w3id.org/pmd/mo
has super-classes
X-ray Mapping c

Annotation Properties

abbreviationap back to ToC or Annotation Property ToC

IRI: https://w3id.org/pmd/co/abbreviation

abbreviationap back to ToC or Annotation Property ToC

IRI: https://w3id.org/pmd/mo/abbreviation

alt labelap back to ToC or Annotation Property ToC

IRI: http://www.w3.org/2004/02/skos/core#altLabel

bibliographic citationap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/bibliographicCitation

creatorap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/elements/1.1/creator

definitionap back to ToC or Annotation Property ToC

IRI: http://www.w3.org/2004/02/skos/core#definition

definition sourceap back to ToC or Annotation Property ToC

IRI: https://w3id.org/pmd/co/definitionSource

exampleap back to ToC or Annotation Property ToC

IRI: http://www.w3.org/2004/02/skos/core#example

licenseap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/elements/1.1/license

pref labelap back to ToC or Annotation Property ToC

IRI: http://www.w3.org/2004/02/skos/core#prefLabel

titleap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/title

Legend back to ToC

c: Classes

Acknowledgments back to ToC

The authors would like to thank Silvio Peroni for developing LODE, a Live OWL Documentation Environment, which is used for representing the Cross Referencing Section of this document and Daniel Garijo for developing Widoco, the program used to create the template used in this documentation.